Image Dimension Measurement System

Specifications

Application Examples

Features

Dimensions

Quick Start Guide

Product Overview

Image Dimension Measurement System

• Drastically Reduced Measurement Time

• Eliminating Individual Differences

• Easy Setup for Wider Applications

• Easy Data Management

Instant measurement is provided by a totally new dimension analysis system which defies traditional metrology techniques. Data is obtained using a system based on the same optical technology that provides digital microscopes with the industry highest resolution, the image processing technology that gives overwhelming power of problem solving to vision systems, and now with the reliability that is needed for factory automation environments.

Features 1

Image Dimension Measurement System

A Totally New Dimension Measurement System Born from A New Concept which Eliminates the need for X-Y stages with the IM-6500 Series Wide-field Model

For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.

Instant Measurement will answer existing issues associated with conventional methods.

A completely new concept of measuring the dimension of an entire target simultaneously by eliminating the XY stage has been achieved with place-and-press measurement. It greatly improves the efficiency of measurement inspections.

Features 2

Significantly Reduced Inspection Time

Just Place and Press to Measure 99 Features in Seconds.

For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.

Every measurement requires more time 99 features are measured in seconds.

In addition to initial positioning of the target, you needed to move the stage to measure each point. The measurement time increases in proportion to the number of measurement points. The time further increases when focus adjustment is required. Just place a target on the stage and press the button. The location and orientation are automatically adjusted. Simple place-and-press operation measures 99 features in seconds. Anyone can easily complete measurement in an incredibly short period of time.

Pattern search for automatic orientation correction [Industry first]

The location and orientation of the target placed on the stage are automatically adjusted based on the recorded shape of the target. There is no need for positioning of a target or preparation of a jig at the beginning of measurement. This is literally place-and-press measurement.

Simultaneous measurement of 99 features by capturing an entire part [Industry first]

This is a completely new measurement system which measures by capturing the entire image of a target within the field of view. It does not require time for alignment of the stage and completes the measurement of 99 features in seconds. Measurement time can be reduced significantly compared with conventional optical comparators, measuring microscopes and optical CMMs.

Batch measurement for further reduction in measurement time [Industry first]

The dimensions of all targets on the stage are measured simultaneously. Even when the targets are placed randomly, it is unnecessary to align them in a jig because the location and orientation of each target is automatically adjusted before measurement. This further reduces measurement time.

Features 3

Eliminating Individual Variations

Same Results no Matter who Carried Out the Measurement

For more details, download the PRODUCT CATALOG by clicking the CATALOG icon above.

Different results caused by individual operator habits or skill levels Latest image processing technology for stable measurement

The results varied not only among individual users but also among measurements performed by the same user depending on the measured features,specified target edge and focus adjustment. Just place a target and press the button. The location and orientation of the target are automatically adjusted and measurement is performed using the specified points.